-
1 deep-level defects
дефекты с глубокими уровнямиБольшой англо-русский и русско-английский словарь > deep-level defects
-
2 deep-level defects
Англо-русский словарь технических терминов > deep-level defects
-
3 deep-level defects
Техника: дефекты с глубокими уровнями -
4 deep-level defects
English-Russian dictionary of electronics > deep-level defects
-
5 defect
1) порок; дефект; несовершенство2) фаут ( порок древесины)3) неисправность; повреждение•-
angular defect
-
antiside defect
-
aperture defect
-
assembly defect
-
black-spot defect
-
bulk defect
-
critical defect
-
crystalline defect
-
deep-level defects
-
dimensional defect
-
distorted stitches knitting defect
-
drop stitches knitting defect
-
electron-irradiation defects
-
fabric defect
-
fabric holes knitting defect
-
fatal defect
-
grown-in defect
-
haze defect
-
hillock-type defect
-
horizontal streaks knitting defect
-
image defect
-
impurity defect
-
internal defects
-
interstitial defect
-
intrinsic defect
-
latent defect
-
lattice defect
-
line defect
-
machine barre knitting defect
-
major defect
-
mass defect
-
migrating lattice defect
-
minor defect
-
needle lines knitting defect
-
off-patterned knitting defect
-
opaque defect
-
oxide defect
-
part-through-the-wall defect
-
pipe defect
-
point defect
-
press-off knitting defect
-
primary defect
-
radiation-induced defect
-
radiation defect
-
saw blade defect
-
shape defect
-
snagged stitches knitting defect
-
spongy defect
-
spot defect
-
structural defect
-
substitutional defect
-
surface defect
-
vacancy defect
-
vertical lines knitting defect
-
welding defect
-
weldment defect
-
wiskering knitting defect -
6 defect
1. порок; дефект; неисправность2. повреждение
* * *
1. дефект; недостаток; порок; изъян; несовершенство || дефектный2. неисправность; повреждение || неисправный; повреждённый3. недостаток, нехватка
* * *
1) дефект; недостаток; порок; изъян; несовершенство || дефектный2) неисправность; повреждение || неисправный; повреждённый3) недостаток, нехватка•free from defect — бездефектный;
defects per hundred units — число дефектов на сто изделий;
defects per unit — число дефектов на изделие;
to correct defects — устранять дефекты;
- allowable defectsto overcome defects — устранять дефекты;
- assembling defect
- assembly defect
- birth defect
- casting defect
- chronic defect
- condemnable defect
- controllable defect
- crack-like defect
- critical defect
- debugged defect
- deep-level defect
- design defect
- deterioration defect
- dimensional defect
- discovered defect
- dynamic defect
- eliminable defect
- embryonic defect
- equivalent defects
- external defect
- fabrication defect
- fatal defect
- fault defect
- fundamental defect
- gross defect
- hidden defect
- identifiable defect
- inadvertent defect
- incidental defect
- incipient defect
- independent defects
- indistinguishable defects
- induced defect
- inherent defect
- inherited defect
- in-process defect
- in-service defect
- internal defect
- intrinsic defect
- invisible defect
- killing defect
- latent defect
- leading defect
- local defect
- macroscopic defect
- major defect
- man-made defect
- manufacturing defect
- material defect
- mechanical defect
- minor defect
- multiple defects
- natural defect
- nonfunctional defect
- noninspectable defect
- nonmeasurable defect
- nonoperational defect
- nonrepairable defect
- nonsignificant defect
- observed defect
- obvious defect
- open defect
- operational defect
- operator controllable defect
- physical defect
- point defect
- potential defect
- pouring defect
- primary defect
- process-induced defect
- processing defect
- proven defect
- random defect
- reliability defect
- removable defect
- repairable defect
- revealed defect
- rolling defect
- secondary defect
- serious defect
- service defect
- shape defect
- shrinkage defect
- significant defect
- simulated defect
- source defect
- special defect
- sporadic defect
- spot defect
- spurious defect
- stratified defect
- structural defect
- surface defect
- technological defect
- tolerance limit defect
- true defect
- typical defect
- unrepairable defect
- visible defect
- visual defect
- volume defect
- welding defect
- weldment defect
- workmanship defect
- zero defects* * * -
7 defect
1) фтт дефект2) неисправность; повреждение3) тлв искажение•- birth defect
- bulk defect
- centering defect
- crystalline defect
- deep-level defect
- fault defect
- Frank defect
- Frenkel defect
- grown-in defect
- growth defect
- image defect
- impurity defect
- intermittent defect
- interstitial defect
- ion-implantation defect
- lattice defect
- light-sensitive defect
- linear defect
- loop-shaped defect
- mass defect
- microshort defect
- planar defect
- point defect
- primary defect
- process-induced defect
- protrusive defect
- quantum defect
- radiation defect
- radiation-induced defect
- Schottky defect
- secondary defect
- Shockley defect
- stoichiometric defect
- structural defect
- substitutional defect
- surface defect
- two-dimensional defect
- vacancy defect
- zero defects -
8 defect
1) фтт. дефект2) неисправность; повреждение3) тлв. искажение•- birth defect
- bulk defect
- centering defect
- crystalline defect
- deep-level defect
- fault defect
- Frank defect
- Frenkel defect
- grown-in defect
- growth defect
- image defect
- impurity defect
- intermittent defect
- interstitial defect
- ion-implantation defect
- lattice defect
- light-sensitive defect
- linear defect
- loop-shaped defect
- mass defect
- microshort defect
- planar defect
- point defect
- primary defect
- process-induced defect
- protrusive defect
- quantum defect
- radiation defect
- radiation-induced defect
- Schottky defect
- secondary defect
- Shockley defect
- stoichiometric defect
- structural defect
- substitutional defect
- surface defect
- two-dimensional defect
- vacancy defect
- zero defectsThe New English-Russian Dictionary of Radio-electronics > defect
См. также в других словарях:
Deep-level trap — Deep level traps or deep level defects are a generally undesirable type of electronic defect in semiconductors. They are deep in the sense that the energy required to remove an electron or hole from the trap to the valence or conduction band is… … Wikipedia
Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are … Wikipedia
Crystallographic defects in diamond — Synthetic diamonds of various colors grown by the high pressure high temperature technique, the diamond size is 2 mm … Wikipedia
Star Trek: Deep Space Nine — intertitle Format Military science fiction Created by Rick Berman Michael Piller … Wikipedia
Drive Level Capacitance Profiling — (DLCP) is a type of capacitance voltage profiling characterization technique developed specifically for amorphous and polycrystalline materials which have more anomalies such as deep levels, interface states, or nonuniformities. Whereas in… … Wikipedia
Radiation hardening — is a method of designing and testing electronic components and systems to make them resistant to damage or malfunctions caused by ionizing radiation (particle radiation and high energy electromagnetic radiation),[1] such as would be encountered… … Wikipedia
diagnosis — /duy euhg noh sis/, n., pl. diagnoses / seez/. 1. Med. a. the process of determining by examination the nature and circumstances of a diseased condition. b. the decision reached from such an examination. Abbr.: Dx 2. Biol. scientific… … Universalium
Lau Wai Shing — Wai Shing Lau (simplified Chinese name: 刘偉成, born July 29, 1955 in Hong Kong) is also known as Lau Wai Shing. The family name of Lau is sometimes spelled as Liu like Liu Bang (founder of the Han dynasty) or Liu Shaoqi or Liu Bocheng. This is… … Wikipedia
Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… … Wikipedia
Crystallographic defect — Crystalline solids exhibit a periodic crystal structure. The positions of atoms or molecules occur on repeating fixed distances, determined by the unit cell parameters. However, the arrangement of atom or molecules in most crystalline materials… … Wikipedia
Thermally stimulated current — (TSC) spectroscopy is an important technique used to study energy levels in semiconductors or insulators (organic or inorganic). Energy levels are first filled either by optical or electrical injection usually at a relatively low temperature,… … Wikipedia